Electronic digital logic circuitry – Interface – Current driving
Reexamination Certificate
2006-10-17
2006-10-17
Cho, James (Department: 2819)
Electronic digital logic circuitry
Interface
Current driving
C326S083000, C326S089000, C327S387000, C327S389000, C327S405000
Reexamination Certificate
active
07123054
ABSTRACT:
A semiconductor integrated circuit device includes a semiconductor integrated circuit formed in a semiconductor chip, and a switching element that is formed in the semiconductor chip and has a current path whose one end and the other end are both connected to the semiconductor integrated circuit. The switching element receives a control signal produced by a control circuit and causes a current to flow from the one end to the other end of the current path by a bipolar operation. The semiconductor integrated circuit device further includes the control circuit that is formed in the semiconductor chip and configured to control a conductive
on-conductive state of the current path of the switching element.
REFERENCES:
patent: 5475333 (1995-12-01), Kumagai
patent: 5596295 (1997-01-01), Ueno et al.
patent: 5612582 (1997-03-01), Shichi et al.
patent: 6249414 (2001-06-01), Lee et al.
patent: 6356138 (2002-03-01), Ohshima
patent: 6433979 (2002-08-01), Yu
patent: 7-240510 (1995-09-01), None
patent: 2001-308282 (2001-02-01), None
patent: 02/075891 (2002-09-01), None
“GGSCRs: GGNMOS Triggered Silicon Controlled Rectifiers for ESD Protection in Deep Sub-Micron CMOS Process” by C. Russ, M. Mergens, K.Verhaege, J. Armer, P. Jozwiak, G. Kolluri, L. Avery Published in 2001.
Notification of Reasons for Rejection mailed on Oct. 3, 2005 in connection with the related Japanese Patent Application No. 2003-209073. English translation of the Office Action is enclosed.
Russ, et al., “GGSCRs: GGNMOS Triggered Silicon Controlled Rectifiers for ESD Protection in Deep Sub-Micron CMOS Proceses,” EOS/ESD Symposium, 2001. Sep. 9-13, 2001.
Satou Youichi
Sei Toshikazu
Yamaguchi Akira
Cho James
Crawford Jason
DLA Piper (US) LLP
Kabushiki Kaisha Toshiba
LandOfFree
Semiconductor integrated circuit device having an ESD... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor integrated circuit device having an ESD..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device having an ESD... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3719152