Semiconductor integrated circuit device having a test function

Details Semiconductor integrated circuit device having a test function Semiconductor integrated circuit device having a test function

2006-06-06

2006-06-06

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S201000, C365S230030, C365S233100

Reexamination Certificate

active

07057948

ABSTRACT:
A semiconductor memory device includes a memory collar, a repair data analyzer, a BIST block, and a system logic. The memory collar includes a memory cell and a spare cell and have a redundancy function of replacing fail memory cell with the spare cell if fail memory cell exists. The repair data analyzer determines whether or not memory cell included in the memory collar is defective, and generates fail address corresponding to the memory cell determined as being defective. The BIST block operates in synchrony with a first clock signal inputted to a first clock signal terminal in a test operation mode, and controls the operation of the memory collar. The system logic operates in synchrony with a second clock signal inputted to a second clock signal terminal in the test operation mode.

REFERENCES:
patent: 5801986 (1998-09-01), Matsumoto et al.
patent: 6166972 (2000-12-01), Hidaka
patent: 4-208880 (1992-07-01), None

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