Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-12-05
2010-11-09
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07831939
ABSTRACT:
In a semiconductor integrated circuit design method for carrying out a design of circuit patterns, a plurality of circuit patterns are defined, and each of the circuit patterns is composed of at least one minimum unit area. One of the circuit patterns is selected, and an expansion area is defined with respect to the selected circuit pattern so that the selected circuit pattern is at least included in the expansion area. An area ratio of an area size of the circuit pattern or circuit patterns included in the expansion area to an area size of the expansion area is calculated, and the area ratio is compared with a reference value.
REFERENCES:
patent: 2002/0179941 (2002-12-01), Ootake et al.
patent: 2002/0185742 (2002-12-01), Ootake et al.
patent: 2005-62601 (2005-03-01), None
Lin Sun J
NEC Electronics Corporation
Young & Thompson
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