Semiconductor integrated circuit device and semiconductor...

Details Semiconductor integrated circuit device and semiconductor... Semiconductor integrated circuit device and semiconductor...

2006-05-23

2006-05-23

Le, Thong (Department: 2818)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S233100

Reexamination Certificate

active

07050349

ABSTRACT:
A programming circuit includes an LT fuse read circuit programming a defective address during a wafer-processing, an electrical fuse circuit electrically programming a defective address, an electrical fuse circuit storing therein whether the electrical fuse circuit is used, a select circuit receiving data programmed by the LT fuse and that programmed by the electrical fuse for switch and output, an electrical fuse circuit designating a switching of the select circuit, and a repair decision circuit comparing an output received from the select circuit and an input address received from the address buffer.

REFERENCES:
patent: 6166981 (2000-12-01), Kirihata et al.
patent: 6191982 (2001-02-01), Morgan
patent: 6426911 (2002-07-01), Lehmann et al.
patent: 2001/0046170 (2001-11-01), Sher et al.
patent: 2 349 249 (2000-10-01), None
patent: 2000-207896 (2000-07-01), None
S. Fujii, et al “A Low-Power Sub 100 NS 256K Bit Dynamic RAM” IEEE Journal of Solid-State Circuits, vol. SC-18, No. 5, Oct. 1983, pp. 441-446.

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