Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-07-01
2010-11-09
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S063000, C365S225700, C365S189070, C365S189080
Reexamination Certificate
active
07830736
ABSTRACT:
A semiconductor integrated circuit device includes a first fuse circuit, a second fuse circuit, and a control signal generating circuit which sends a first control signal and executes program such that the resistance value of the first fuse circuit becomes greater than the resistance value of the second fuse circuit, and sends a second control signal and executes reprogram such that the resistance value of the second fuse circuit becomes greater than the resistance value of the first fuse circuit.
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Amano Tetsuya
Hojo Takehiko
Kobayashi Tomohiro
Kabushiki Kaisha Toshiba
Nguyen Viet Q
Turocy & Watson LLP
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