Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-04-24
2007-04-24
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C324S071500, C324S606000, C324S765010, C324S762010, C257S021000
Reexamination Certificate
active
10831610
ABSTRACT:
Functional circuits such as a processor, an SRAM, a DRAM and a flash-EEPROM are mounted on a semiconductor chip. Of these functional circuits, for example, the flash-EEPROM which fluctuates a potential of the semiconductor chip is separated from the other circuits by means of a separating region provided in the semiconductor chip. In addition, the separating region is put in contact with the entire side faces of the semiconductor chip.
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Fenty Jesse A.
Hogan & Hartson LLP
Kabushiki Kaisha Toshiba
Parker Kenneth
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