Electronic digital logic circuitry – Signal sensitivity or transmission integrity
Reexamination Certificate
2008-04-18
2009-10-20
Le, Don P (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
C326S082000, C327S534000
Reexamination Certificate
active
07605601
ABSTRACT:
A semiconductor integrated circuit device, has a semiconductor substrate; and a first transistor of a first conductivity type and a second transistor of the first conductivity type, the transistors being connected in series between a first power supply line and a first substrate well provided on the semiconductor substrate, the semiconductor integrated circuit device further comprising a first transistor of a second conductivity type and a second transistor of the second conductivity type, the transistors being connected in series between the second power supply line and a second substrate well provided on the semiconductor substrate.
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Tachibana Fumihiko
Yamashita Takahiro
Kabushiki Kaisha Toshiba
Le Don P
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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