Semiconductor integrated circuit device

Electronic digital logic circuitry – Signal sensitivity or transmission integrity

Reexamination Certificate

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Details

C326S082000, C327S534000

Reexamination Certificate

active

07605601

ABSTRACT:
A semiconductor integrated circuit device, has a semiconductor substrate; and a first transistor of a first conductivity type and a second transistor of the first conductivity type, the transistors being connected in series between a first power supply line and a first substrate well provided on the semiconductor substrate, the semiconductor integrated circuit device further comprising a first transistor of a second conductivity type and a second transistor of the second conductivity type, the transistors being connected in series between the second power supply line and a second substrate well provided on the semiconductor substrate.

REFERENCES:
patent: 6512394 (2003-01-01), Parris
patent: 6593799 (2003-07-01), De et al.
patent: 6864539 (2005-03-01), Ishibashi et al.
patent: 6943613 (2005-09-01), Miyazaki et al.
patent: 7368976 (2008-05-01), Gupta et al.
patent: 2005/0052219 (2005-03-01), Butler et al.
patent: 2004-289107 (2004-10-01), None

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