Semiconductor integrated circuit device

Static information storage and retrieval – Associative memories

Reexamination Certificate

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Details

C365S049120, C365S049160, C365S049180

Reexamination Certificate

active

07619911

ABSTRACT:
In a memory array structured of memory cells using a storage circuit STC and a comparator CP, either one electrode of a source electrode or a drain electrode of a transistor, whose gate electrode is connected to a search line, of a plurality of transistors structuring the comparator CP is connected to a match line HMLr precharged to a high voltage. Further, a match detector MDr is arranged on a match line LMLr precharged to a low voltage to discriminate a comparison signal voltage generated at the match line according to the comparison result of data. According to such memory array structure and operation, comparison operation can be performed at low power and at high speed while influence of search-line noise is avoided in a match line pair. Therefore, a low power content addressable memory which allows search operation at high speed can be realized.

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Johns et al., Analog Integrated Circuit Design, 1997, John Wiley & Sons, Inc., p. 94.
Lines et al., 66MHz 2.3M Ternary Dynamic Content Addressable Memory, Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, 2000, pp. 101-105.

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