Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1994-04-13

1995-09-12

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

30518909, 30518911, 305149, 39518318, G11C 700, G01R 3128

Patent

active

054503620

ABSTRACT:
A semiconductor integrated circuit device having internal circuits, and a test mode selecting circuit. The selecting circuit includes a first load device, a transistor having a first terminal receiving a signal via the first load device, a control terminal receiving a first voltage and a second terminal, and a second load device provided between the second terminal of the transistor and a reference voltage node. A test mode selecting signal is output via the second terminal of the transistor when a second voltage higher than the voltage of the signal applied to the first load device in a normal operation mode is applied thereto. The test mode selecting signal is applied to predetermined internal circuits among said internal circuits, so that the predetermined internal circuits are switched to states of a test mode from the normal operation mode.

REFERENCES:
patent: 5177745 (1993-01-01), Rozman
patent: 5276647 (1994-01-01), Matsui et al.
patent: 5289475 (1994-02-01), Slemmer
patent: 5317532 (1994-05-01), Ochii

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