Semiconductor integrated circuit device

Electronic digital logic circuitry – Interface

Reexamination Certificate

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Details

C326S037000, C326S041000, C326S047000, C326S101000

Reexamination Certificate

active

07911231

ABSTRACT:
A semiconductor integrated circuit device1includes a plurality of basic cells5each having therein a logic transistor2that performs logical operations, and a power switching transistor3that can interrupt leakage current when the logic transistor2is not operated. The semiconductor integrated circuit device1further includes a wiring6that connects virtual power nodes4as the connection points between the logic transistors2and the power switching transistors3, between individual basic cells5aand5bincluded in a plurality of basic cells5. Here, a basic cell includes a power switching transistors3that can interrupt leakage current when the logic transistors2are not operated, in addition to the logic transistors2. Thereby, switching transistors3can be disposed in the optimal positions of the cells5, and basic cells5having a small restriction in disposition and wide scope of application can be provided.

REFERENCES:
patent: 2004/0080340 (2004-04-01), Hidaka
patent: 2003-249563 (2003-09-01), None
patent: 2004-186666 (2004-07-01), None
patent: 2004-350058 (2004-12-01), None
Usami et al, Automated Selective Multi-Threshold Design for Ultra-Low Standby Applications, ISPLED, 2002, pp. 202-206.
U.S. Office Action for U.S. Appl. No. 11/691,047 mailed on Oct. 20, 2008.
U.S. Office Action for U.S. Appl. No. 11/691,047 mailed on Jun. 6, 2009.
U.S. Office Action for U.S. Appl. No. 11/691,047 mailed on Oct. 20, 2009.

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