Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2011-05-10
2011-05-10
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S226000, C365S189110, C365S185220, C365S185240
Reexamination Certificate
active
07940579
ABSTRACT:
A semiconductor integrated circuit device includes: a memory cell array composed of electrically rewritable memory cells; an internal voltage generating circuit having a boosting circuit for generating a voltage boosted from a supply voltage, and a voltage detecting circuit for detecting an output voltage of the boosting circuit as a monitor voltage and controlling on/off of the boosting circuit for holding the output voltage of the boosting circuit at a specified level, the internal voltage generating circuit outputting the output voltage of the boosting circuit as an internal voltage; a control circuit for controlling the internal voltage generating circuit; and a writing circuit for applying the internal voltage to the memory cell as a writing voltage when writing data into the memory cell, wherein the control circuit controls the internal voltage to a first voltage necessary for writing data into the memory cell when writing data into the memory cell, and to a second voltage lower than the first voltage in a write verify operation following the data write operation.
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Kabushiki Kaisha Toshiba
Nguyen Viet Q
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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