Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1995-08-23

1997-07-08

Ngo, Ngan V.

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

257203, 257207, 257210, H01L 2710

Patent

active

056464223

ABSTRACT:
A semiconductor integrated circuit device includes an internal function circuit formed on a first rectangular region on a rectangular semiconductor chip for implementing a function specific to the device, and a predetermined function control circuit formed on a second rectangular region for implementing a fixed function irrespective of the function implemented by said internal function circuit. First and second rectangular regions are separate regions. In the hierarchical design of an integrated circuit device, the circuit of the first rectangular region can be used as the structure component of another integrated circuit on another chip. The predetermined function control circuit can be laid out on the second rectangular region of another chip. The predetermined function control circuit is a testing circuit of boundary scan method, including a standardized structure component.

REFERENCES:
patent: 4782283 (1988-11-01), Zasio
patent: 4872169 (1989-10-01), Whetsul, Jr.
"Standard Test Access Port and Boundary-Scan Architecture", IEEE Standard 1149.1/D6, Nov. 1989, pp. 1-1 to 5-17.

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