Semiconductor integrated circuit and test method therefor

Details Semiconductor integrated circuit and test method therefor Semiconductor integrated circuit and test method therefor

1998-03-11

2000-08-29

Hoff, Marc S.

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

702118, G01R 1512

Patent

active

061121630

ABSTRACT:
A reconfigurable circuit is reconstructed to three or more operating circuit blocks. Upon testing, the same data is inputted to each of the reconstructed operating circuit blocks. A majority circuit formed in the reconfigurable circuit compares results of operations of the operating circuit blocks and outputs information indicating which of the operating circuit blocks is in trouble.

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"XC6200 Field Programmable Gate Arrays", Xilinx, Jan. 9, 1997, pp. 1-53.

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