Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-07
2009-08-04
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C714S700000, C714S704000, C714S718000, C713S401000, C713S501000, C702S058000, C327S210000, C327S333000
Reexamination Certificate
active
07571407
ABSTRACT:
A semiconductor integrated circuit comprises: a first area, formed on a semiconductor chip, which operates at a first predetermined voltage and a first predetermined frequency; a second area, formed on the semiconductor chip, which operates at a second voltage and a second frequency lower than the first voltage and the first frequency, respectively, and also operates after a shift to the first voltage and the first frequency; and a third area, formed on the semiconductor chip, which operates at the first voltage and a frequency which operates the second area and transmits and receives signals sent between the first area and the second area; the third area possessing a delay analysis endpoint that can analyze each of a first delay occurring between the first area and the third area and a second delay occurring between the second area and the third area.
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Foley & Lardner LLP
Kabushiki Kaisha Toshiba
Levin Naum B
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