Semiconductor integrated circuit and method of measuring a...

Details Semiconductor integrated circuit and method of measuring a... Semiconductor integrated circuit and method of measuring a...

2009-01-15

2010-12-14

Luu, Pho M (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bidirectional bus

C365S194000, C365S191000

Reexamination Certificate

active

07852689

ABSTRACT:
A semiconductor integrated circuit includes a memory, a master interface circuit that performs one of receiving a data transfer request from the memory and outputting a data transfer request to the memory, a slave interface circuit that performs one of receiving data from the memory and outputting data to the memory in response to the data transfer requests, and a delay circuit that delays a data transfer end signal that indicates one of an end of a data transfer from the memory and an end of a data transfer to the memory.

REFERENCES:
patent: 4502117 (1985-02-01), Kihara
patent: 5892957 (1999-04-01), Normoyle et al.
patent: 6034542 (2000-03-01), Ridgeway
patent: 6253333 (2001-06-01), Bogumil et al.
patent: 6499072 (2002-12-01), Frank et al.
patent: 7181639 (2007-02-01), Chua-Eoan et al.
patent: 7577048 (2009-08-01), Felix
patent: 2005/0228914 (2005-10-01), Ishida
patent: 2006/0085600 (2006-04-01), Miyashita et al.
patent: 2006/0285413 (2006-12-01), Shinozaki et al.
patent: 58-151631 (1983-09-01), None

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit and method of measuring a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit and method of measuring a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit and method of measuring a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4175383