Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-11-22
2005-11-22
Nguyen, Viet Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S225700, C365S063000, C365S189030, C365S189080
Reexamination Certificate
active
06967881
ABSTRACT:
A semiconductor integrated circuit makes use of nonvolatile memory cells of a fuse circuit connected to a dedicated signal line without using a nonvolatile memory intended for general purpose use, which is connected to a common bus, in order to store control information for defect relief and the like of circuit modules. The reliability of storage of the control information is not limited to the performance of storage of information in the nonvolatile memory intended for general purpose use, and the reliability of storage of the control information can be easily enhanced. Since a second wiring used in the transfer of the control information is of a wiring dedicated for its transfer, it needs not perform switching between connections to circuit portions used for actual operations in the circuit modules and their control. A circuit configuration for delivering the control information can be simplified.
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Sasaki Toshio
Yamada Toshio
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