Semiconductor integrated circuit and method for detecting...

Details Semiconductor integrated circuit and method for detecting... Semiconductor integrated circuit and method for detecting...

2007-06-19

2007-06-19

Lee, Calvin (Department: 2818)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C365S203000

Reexamination Certificate

active

11058380

ABSTRACT:
Provided are a semiconductor integrated circuit including a unit which detects soft defects in a pull-up circuit of a static memory cell, and a soft defect detection method and a testing method thereof. The semiconductor integrated circuit includes a static memory cell, a bit line connected to a first node of the static memory cell and a complementary bit line connected to a second node of the static memory cell, and an equalization circuit connected to the bit line and the complementary bit line to equalize the bit line and the complementary bit line in response to a test signal during a test mode. The semiconductor integrated circuit and the soft defect detection method can rapidly detect soft defects in the pull-up circuit of the static memory cell without a retention test. Furthermore, the testing method can rapidly detect soft defects in the pull-up circuit of the static memory cell, allowing the test time to be drastically reduced.

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