Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2008-04-29

2008-04-29

Louis-Jacques, Jacques (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

10892298

ABSTRACT:
Test functions are expanded by adopting a self test part, and circuit scale is reduced by adding the self test part. A semiconductor integrated circuit includes a memory that includes plural memory banks and is accessed by specifying a bank address, an X address, and a Y address, and a self-test part that tests the memory in response to commands. The self-test part has an address counter covering plural addressing modes that are different in the updating of X addresses, Y addresses, and bank addresses. A variety of addressing modes provided expand BIST-based test functions.

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