Semiconductor integrated circuit

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S225700, C365S230060

Reexamination Certificate

active

10726544

ABSTRACT:
Fuse data is supplied to each of a plurality of function blocks through a transfer path using shift registers. When the reliability of fuse elements is low, there is a possibility that a part of the fuse data may have an error. Further, when the transfer path of the fuse data is long, there is a possibility that a value of the fuse data may be inverted due to an influence of noises. Thus, a decoder is arranged in the transfer path of the fuse data, and encoded data is stored in the fuse elements. By performing error detection/correction in the decoder, the high reliability is assured with respect to chip operations and the like.

REFERENCES:
patent: 4010449 (1977-03-01), Faggin et al.
patent: 4506385 (1985-03-01), Fedde et al.
patent: 6009040 (1999-12-01), Choi et al.
patent: 6011735 (2000-01-01), Ooishi et al.
patent: 6577534 (2003-06-01), Tsuruda
patent: 6633183 (2003-10-01), Duesman
patent: 6654286 (2003-11-01), Kawakami
patent: 2001-358313 (2001-12-01), None
patent: 2002-133895 (2002-05-01), None
patent: 2003-233999 (2003-08-01), None
Michael R. Ouellette, et al., “Shared Fuse Macro for Multiple Embedded Memory Devices with Redundancy”, IEEE 2001 Custom Integrated Circuits Conference, 2001, pp. 191-194.
T. C. May, et al., IEEE Transactions On Electron Devices, vol. ED-26, No. 1, pp. 2-9, “Alpha-Particle-Induced Soft Errors in Dynamic Memories”, Jan. 1979.
J.F. Ziegler, et al., IEEE Journal of Solid-State Circuits, vol. 33, No. 2, pp. 246-252, “Cosmic Ray Soft Error Rates of 16-MB Dram Memory Chips”, Feb. 1998.

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