Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-09-04
2007-09-04
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700, C365S230060
Reexamination Certificate
active
10726544
ABSTRACT:
Fuse data is supplied to each of a plurality of function blocks through a transfer path using shift registers. When the reliability of fuse elements is low, there is a possibility that a part of the fuse data may have an error. Further, when the transfer path of the fuse data is long, there is a possibility that a value of the fuse data may be inverted due to an influence of noises. Thus, a decoder is arranged in the transfer path of the fuse data, and encoded data is stored in the fuse elements. By performing error detection/correction in the decoder, the high reliability is assured with respect to chip operations and the like.
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Haga Ryo
Nagai Takeshi
Kabushiki Kaisha Toshiba
Nguyen Tan T.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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