Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2006-02-28

2006-02-28

Hoang, Huan (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S233100, C365S194000

Reexamination Certificate

active

07006395

ABSTRACT:
An semiconductor integrated circuit that uses a low-frequency operation clock to implement probing for fast operation. This semiconductor integrated circuit comprises a time adjustment circuit for adjusting the pulse width of enable signals. In normal mode, the time adjustment circuit does not convert the pulse width of enable signals. However, during probing, the time adjustment circuit converts an enable signal into an enable signal with a short pulse width for testing. In normal mode, a memory control circuit operates to synchronize with an unconverted enable signal. During probing, it operates in synchronization with an enable signal converted to one with a shorter pulse width.

REFERENCES:
patent: 5629895 (1997-05-01), Dosaka et al.
patent: 6011728 (2000-01-01), Akeyama
patent: 6748549 (2004-06-01), Chao et al.
patent: 11317098 (1999-11-01), None
patent: 2001014894 (2001-01-01), None

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