Electronic digital logic circuitry – Function of and – or – nand – nor – or not – Field-effect transistor
Reexamination Certificate
2005-08-30
2005-08-30
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
Function of and, or, nand, nor, or not
Field-effect transistor
C326S112000, C326S119000, C326S031000
Reexamination Certificate
active
06937068
ABSTRACT:
An integrated circuit having a CMOS circuit constituted by electrically connecting an n-type well2, in which p-channel transistor Tp of the CMOS circuit is set, with a supply line Vdd through switching transistor Tps, and electrically connecting a p-type well3, in which n-channel transistor Tn of the CMOS circuit is set, with supply line Vss through switching transistor Tns. Thermal runaway due to leakage current can be controlled by turning off switching transistors Tps and Tns and supplying potentials suitable for a test to the n-type well2and the p-type well3from an external unit when the integrated circuit is being tested. Fluctuations of the latch-up phenomenon and operation speed can be prevented by turning on switching transistors Tps and Tns and setting the n-type well2and the p-type well3to the voltages Vdd and Vss, respectively.
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Hamamoto Masato
Isomura Satoru
Mori Kazutaka
Nakayama Michiaki
Antonelli Terry Stout & Kraus LLP
Hitachi , Ltd.
Tran Anh Q.
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