Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-06-03
2008-06-03
Ha, Nathan W (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
Reexamination Certificate
active
07382020
ABSTRACT:
Upstanding thin-film channel regions5having different heights are formed between source regions7and drain regions8of MOS transistors, respectively.
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Bin Yu, et al., “FinFET Scaling To 10nm Gate Length”, IEDM Tech. Dig., 2002, pp. 251-254.
Digh Hisamoto, et al., “FinFET-A Self-Aligned Double-Gate MOSFET Scalable To 20 nm”, IEEE Trans.Electron Devices. vol. 47, No. 12, 2000, pp. 2320-2325.
Ishii Kenichi
Liu Yongxun
Masahara Meishoku
Sekigawa Toshihiro
Suzuki Eiichi
Ha Nathan W
Morgan & Lewis & Bockius, LLP
National Institute of Advanced Industrial Science and Technology
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