Semiconductor element evaluating apparatus

Details Semiconductor element evaluating apparatus Semiconductor element evaluating apparatus

1996-03-11

1998-09-01

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3102

Patent

active

058015280

ABSTRACT:
A semiconductor element evaluating apparatus for evaluating an electrical characteristic of a semiconductor element used in a microwave band includes a pedestal having first and second waveguide parts for exchanging signals with external devices and penetrating the pedestal, a mode converting carrier member placed on the pedestal and having first and second waveguide parts and first and second microstrip lines sandwiching a region where a semiconductor element is to be mounted, and waveguide terminal structures placed on the mode converting carrier member. The first and second waveguide parts of the pedestal, the mode converting carrier member, and the terminal parts form first and second waveguides. One semiconductor element can be exchanged for another semiconductor element merely by exchanging one mode converting carrier member for another, and the length of the transmission line is shortened whereby transmission loss is reduced.

REFERENCES:
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4827211 (1989-05-01), Strid et al.
Angelov et al, "An F-Band Resistive Mixer Based On Heterostructure Field Effect Transistor Technology", IEEE MTT-S Digest, 1993, pp. 787-790 (Mouth unavailable).

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