Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-04
2009-10-06
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S537000, C324S1540PB, C327S334000
Reexamination Certificate
active
07598762
ABSTRACT:
A semiconductor driver circuit includes impedance units for generating impedances at data pads, independently of each-other. Thus, signal swing widths of data signals generated at the data pads may be easily adjusted to be substantially equal for high operating speed. The semiconductor driver circuit also includes switching units for uncoupling at least one of the impedance units from at least one of the data pads for enhanced testing of the data pads.
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patent: 2007/0195604 (2007-08-01), Kim
Byun Gyung-Su
Kim Kyu-Hyoun
Kim Woo-Seop
Chan Emily Y
Choi Monica H.
Nguyen Ha Tran T
Samsung Electronics Co,. Ltd.
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