Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-04-19
2005-04-19
Thomas, Tom (Department: 2815)
Semiconductor device manufacturing: process
With measuring or testing
C438S015000, C438S018000, C257S048000, C257S777000, C257S778000, C257S782000, C257S784000
Reexamination Certificate
active
06881593
ABSTRACT:
A semiconductor die adapter assembly includes a semiconductor die cut from a wafer, the die having an active surface including bond pads. A die adapter, also having bond pads, is bonded to the semiconductor die. Die-to-adapter connectors electrically connect the die bond pads to the adapter bond pads. Finally, adapter-to-substrate connectors electrically connect the adapter bond pads to a device substrate. Having bond pads on the die adapter eliminates the need to break and remake the electrical connections to the original bond pads on the die during burn-in testing of the die.
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Charles, Jr. Harry K.
Le Binh Q.
Lehtonen Seppo J.
Lew Ark L.
Ling Sharon X.
Fasulo, II Albert J.
The Johns Hopkins University
Warren Matthew E.
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