Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-03-22
2011-03-22
Lebentritt, Michael S (Department: 2829)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S754000, C257SE23141, C257SE45001, C257SE45002
Reexamination Certificate
active
07910912
ABSTRACT:
A semiconductor device includes at least one phase-change pattern disposed on a semiconductor substrate. A planarized capping layer, a planarized protecting layer, and a planarized insulating layer are sequentially stacked to surround sidewalls of the at least one phase-change pattern. An interconnection layer pattern is disposed on the planarized capping layer, the planarized protecting layer, and the planarized insulating layer. The interconnection layer pattern is in contact with the phase-change pattern.
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Korean Office Action for Korean application No. 10-2004-0056127; dated Mar. 16, 2006.
Jeong Won-Cheol
Oh Jae-Hee
Park Jae-Hyun
Lebentritt Michael S
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
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