Semiconductor devices and methods of testing the same

Details Semiconductor devices and methods of testing the same Semiconductor devices and methods of testing the same

2006-04-27

2009-08-18

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C714S738000

Reexamination Certificate

active

07576554

ABSTRACT:
A semiconductor device may include a plurality of output electrodes configured to provide electrical coupling for a respective plurality of output signals outside the semiconductor device. A signal generator may be configured to generate the plurality of output signals. In addition, a test circuit may be coupled between the signal generator and the plurality of output electrodes. The test circuit may be configured to couple each of the output signals to a respective one of the output electrodes in a first operating mode, and the test circuit may be configured to sequentially couple each one of the output signals to one of the output electrodes in a second operating mode. Related methods are also discussed.

REFERENCES:
patent: 6163867 (2000-12-01), Miller et al.
patent: 2000-046919 (2000-02-01), None
patent: 2003-287563 (2003-10-01), None
patent: 2000-0005741 (2000-01-01), None
patent: 2001-0058519 (2001-07-01), None

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