Semiconductor devices and methods of fabricating the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

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C438S592000, C438S179000, C438S283000

Reexamination Certificate

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07314814

ABSTRACT:
Semiconductor devices and methods of fabricating the same are disclosed. A disclosed method comprises: partially forming a first gate stack; partially forming a second gate stack adjacent the first gate stack; forming a first interlayer dielectric; and completing the formation of the first and second gate stacks after the first interlayer dielectric has filled a distance between the first and second gate electrodes.

REFERENCES:
patent: 5767004 (1998-06-01), Balasubramanian et al.
patent: 6180501 (2001-01-01), Pey et al.
patent: 6507078 (2003-01-01), Yu
patent: 6562731 (2003-05-01), Liu et al.
patent: 6638801 (2003-10-01), Manabe
patent: 6740549 (2004-05-01), Chen et al.
patent: 6777761 (2004-08-01), Clevenger et al.
patent: 6870231 (2005-03-01), Kim et al.
patent: 2004/0173825 (2004-09-01), Lyu et al.

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