Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate
2006-11-07
2006-11-07
Nguyen, Cuong (Department: 2811)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Total dielectric isolation
C438S413000, C438S424000, C438S425000
Reexamination Certificate
active
07132347
ABSTRACT:
A semiconductor device includes a common diffusion structure formed in each region of a substrate in which semiconductor components are formed. The diffusion structures are separated into sections by trenches to form semiconductor components. The trenches define sizes of the semiconductor components and isolate the semiconductor components from the surrounding area.
REFERENCES:
patent: 5306940 (1994-04-01), Yamazaki
patent: 5994200 (1999-11-01), Kim
patent: 6472254 (2002-10-01), Cantarini et al.
patent: 6653702 (2003-11-01), Ishio et al.
patent: 6791156 (2004-09-01), Itou
patent: 2001/0032990 (2001-10-01), Koyama et al.
Himi Hiroaki
Mizuno Shoji
Nakano Takashi
Denso Corporation
Nguyen Cuong
Posz Law Group , PLC
LandOfFree
Semiconductor device with trench structure and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device with trench structure and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device with trench structure and method for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3700414