Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With electrical contact in hole in semiconductor
Reexamination Certificate
2007-09-18
2007-09-18
Doan, Theresa T. (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Physical configuration of semiconductor
With electrical contact in hole in semiconductor
C257S686000
Reexamination Certificate
active
11206146
ABSTRACT:
Cost is reduced and reliability is improved with a BGA (Ball Grid Array) type semiconductor device which has ball-shaped conductive terminals. A first wiring is formed on an insulation film which is formed on a surface of a semiconductor die. A glass substrate is bonded over the surface of the semiconductor die, and a side surface and a back surface of the semiconductor die are covered with an insulation film. A second wiring is connected to a side surface or a back surface of the first wiring and extending over the back surface of the semiconductor die. A conductive terminal such as a bump is formed on the second wiring.
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European Office Action mailed Apr. 10, 2006, directed to counterpart EP Application No. 03010938.3.
European Office Action dated Aug. 10, 2005, directed to counterpart foreign application.
Ando Tatsuya
Kitagawa Katsuhiko
Noma Takashi
Okigawa Mitsuru
Otagaki Takayasu
Doan Theresa T.
Morrison & Foerster / LLP
Sanyo Electric Co,. Ltd.
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