Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2005-08-09
2005-08-09
Elms, Richard (Department: 2824)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S201000
Reexamination Certificate
active
06928019
ABSTRACT:
A semiconductor device (such as a DRAM) includes a memory array that has dynamic memory cells. In a self refresh test mode, a self refresh test mode controller monitors and/or controls various blocks and internal signals in the semiconductor device. The self refresh test mode controller may communicate with a remote testing device through various conductors including one or more DQ lines and/or one or more address lines. The self refresh test mode controller provides at least one or more of the following four functions: (1) the ability to control internal signals while in self refresh test mode; (2) the ability to monitor internal signals while in self refresh test mode; (3) the ability to put in a programmable delay, change the delay, or change internal timing while in self refresh test mode (add delay or make delay programmable, adjustable); (4) the ability to have the device do a device read in a self refresh test mode (the DQ pins may be used to read particular data on the row, while the column address is frozen).
REFERENCES:
patent: 4317169 (1982-02-01), Panepinto, Jr. et al.
patent: 4453237 (1984-06-01), Reese et al.
patent: 4547867 (1985-10-01), Reese et al.
patent: 4672583 (1987-06-01), Nakaizumi
patent: 5270982 (1993-12-01), Watanabe
patent: 5295109 (1994-03-01), Nawaki
patent: 5299168 (1994-03-01), Kang
patent: 5299969 (1994-04-01), Zaruba
patent: 5299970 (1994-04-01), Fontaine
patent: 5349562 (1994-09-01), Tanizaki
patent: 5386385 (1995-01-01), Stephens, Jr.
patent: 5418754 (1995-05-01), Sakakibara
patent: 5446695 (1995-08-01), Douse et al.
patent: 5450364 (1995-09-01), Stephens, Jr. et al.
patent: 5627791 (1997-05-01), Wright et al.
patent: 5636173 (1997-06-01), Schaefer
patent: 5644544 (1997-07-01), Mizukami
patent: 6392948 (2002-05-01), Lee
patent: 6545925 (2003-04-01), Lee
Elms Richard
Hur J. H.
TraskBritt
LandOfFree
Semiconductor device with self refresh test mode does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device with self refresh test mode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device with self refresh test mode will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3513113