Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate
2005-12-06
2005-12-06
Tra, Quan (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
C365S225700
Reexamination Certificate
active
06972612
ABSTRACT:
An integrated circuit of a semiconductor device has a chip malfunction controlling circuit embedded in a chip. The circuit comprises a fusing part, to which a cutting will be made in the manufacturing process according to the result of the discrimination of a defect in a chip, with one end thereof being connected to a first power terminal. A signal generating part is connected to the other end of the fusing part, and to a second power terminal. The signal generating part generates a discrimination signal of discriminating whether the chip is defective or not, by whether the fusing part has been cut or not. The discrimination signal is supplied to at least one internal function circuit, and inhibits its operation if the fusing part has been cut. Furthermore, the chip malfunction controlling method comprises generating a discrimination signal that has a first state if a test fuse has been cut and a second state if the test fuse has not been cut. Then the discrimination signal is applied to the chip internal function circuits, to inhibit their operation if the fuse has been cut.
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Kang Ki-Sang
Kang Sang-Seok
Shin Kyeong-seon
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
Tra Quan
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