Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2007-07-24
2007-07-24
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C257SE21521
Reexamination Certificate
active
11064282
ABSTRACT:
A semiconductor element and a circuit substrate each having electrodes disposed at narrow pitch are electrically connected with high reliability by conductive paste. A semiconductor device with a semiconductor section and a circuit substrate electrically connected and a method for manufacturing such semiconductor device are provided. The manufacturing method includes processes of: forming semiconductor electrodes at the semiconductor section; forming substrate electrodes at the circuit substrate; firstly affixing one part of the semiconductor section and circuit substrate to an intermediate connector made of insulating material; forming via holes at intermediate connector according to positions of the semiconductor electrodes and positions of the substrate electrodes; electrically connecting each semiconductor electrode and each substrate electrode via each via hole; and secondly affixing the other part of the semiconductor section and circuit substrate to the intermediate connector.
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Andoh Daizo
Higashitani Hideki
Nakamura Tadashi
RatnerPrestia
Stevenson Andre′
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