Semiconductor device with conduction test terminals

Details Semiconductor device with conduction test terminals Semiconductor device with conduction test terminals

2005-06-21

2005-06-21

Pham, Hoai (Department: 2814)

Active solid-state devices (e.g., transistors, solid-state diode

Housing or package

Multiple housings

C257S723000, C257S777000

Reexamination Certificate

active

06909172

ABSTRACT:
A semiconductor device designed to facilitate testing. Superimposed first and second semiconductor chips each include a plurality of internal terminals, an external terminal, and a plurality of transistors. A plurality of wires connect the internal terminals, the transistors, and the external terminals of the first and second semiconductor chips in series.

REFERENCES:
patent: 5528083 (1996-06-01), Malladi et al.
patent: 6441669 (2002-08-01), Ooishi
patent: 6476506 (2002-11-01), O'Connor et al.

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