Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-08-19
2010-12-28
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S329000, C257S330000, C257S331000, C257S332000
Reexamination Certificate
active
07859051
ABSTRACT:
The application relates to a semiconductor device made of silicon with regionally reduced band gap and a process for the production of same. One embodiment provides a semiconductor device including a body zone, a drain zone and a source zone. A gate extends between the source zone and the drain zone. A reduced band gap region is provided in a region of the body zone, made of at least ternary compound semiconductor material.
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Foerster Christian
Hirler Franz
Krumrey Joachim
Siemieniec Ralf
Dicke Billig & Czaja, PLLC
Infineon Technologies Austria AG
Richards N Drew
Sun Yu-Hsi
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