Semiconductor device with a reduced band gap and process

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S328000, C257S329000, C257S330000, C257S331000, C257S332000

Reexamination Certificate

active

07859051

ABSTRACT:
The application relates to a semiconductor device made of silicon with regionally reduced band gap and a process for the production of same. One embodiment provides a semiconductor device including a body zone, a drain zone and a source zone. A gate extends between the source zone and the drain zone. A reduced band gap region is provided in a region of the body zone, made of at least ternary compound semiconductor material.

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patent: 6806533 (2004-10-01), Henninger et al.
patent: 6833584 (2004-12-01), Henninger et al.
patent: 2005/0024925 (2005-02-01), Deboy et al.
patent: 2006/0118863 (2006-06-01), Dolny et al.
patent: 2006/0205194 (2006-09-01), Bauer
patent: 19958234 (2001-06-01), None
Calafut, D. “Trench power MOSFET lowside switch with optimized integrated Schottky diode”, Proc. ISPSD 2004, pp. 397-400.
Fan, X. “SiGeC/Si superlattice microcoolers”, Appl. Phys. Letters, vol. 78, Mar. 2001.

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