Semiconductor device that suppresses variations in high...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For high frequency device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE23004, C257SE23021, C257SE23060, C257SE23101, C257SE23114, C257S737000, C257S738000, C257S778000, C257S692000, C257S693000, C257S681000, C257S698000, C257S786000, C257S779000

Reexamination Certificate

active

07545036

ABSTRACT:
A semiconductor device includes a semiconductor substrate having a main surface, the main surface including a first and second areas formed with a high-frequency circuit element, and a third area located around the first and second areas and formed with a low-frequency circuit element. The semiconductor device also includes a sealing resin which covers the main surface; a plurality of first external terminals which are formed above the third area and which are electrically connected to the high-frequency circuit element, the first external terminals protruding from the surface of the sealing resin. The semiconductor device further includes a plurality of second external terminals which are formed above the third area and which are electrically connected to the low-frequency circuit element, the second external terminals protruding from the surface of the sealing resin.

REFERENCES:
patent: 5814894 (1998-09-01), Igarashi et al.
patent: 5959357 (1999-09-01), Korman
patent: 5990546 (1999-11-01), Igarashi et al.
patent: 6326673 (2001-12-01), Liou
patent: 6384479 (2002-05-01), Yamamoto
patent: 6504096 (2003-01-01), Okubora
patent: 6521485 (2003-02-01), Su et al.
patent: 6545457 (2003-04-01), Goto et al.
patent: 6555921 (2003-04-01), Kwon et al.
patent: 6661078 (2003-12-01), Shitara
patent: 6847066 (2005-01-01), Tahara et al.
patent: 6870256 (2005-03-01), Aoki et al.
patent: 2001/0020737 (2001-09-01), Kwon et al.
patent: 2001/0026021 (2001-10-01), Honda
patent: 2002/0094601 (2002-07-01), Su et al.
patent: 2002/0121689 (2002-09-01), Honda
patent: 2002/0159242 (2002-10-01), Nakatani et al.
patent: 2002/0180062 (2002-12-01), Hsieh et al.
patent: 2003/0116790 (2003-06-01), Kikuchi et al.
patent: 2004/0119140 (2004-06-01), Nishijima
patent: 2005/0221622 (2005-10-01), Shioya et al.
patent: 0543282 (1993-05-01), None
patent: 56-45070 (1981-04-01), None
patent: 08-111506 (1996-04-01), None
patent: 9-306947 (1997-11-01), None
patent: 2000-124358 (2000-04-01), None
patent: 2000-235979 (2000-08-01), None
patent: 20002235979 (2000-08-01), None
patent: 200144367 (2001-02-01), None
patent: 2001060642 (2001-03-01), None
patent: 2001156209 (2001-06-01), None
patent: 2001-284400 (2001-10-01), None
patent: 200226177 (2002-01-01), None
patent: 200257292 (2002-02-01), None
patent: 2002083894 (2002-03-01), None
patent: 20021644678 (2002-06-01), None
patent: 2002231817 (2002-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device that suppresses variations in high... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device that suppresses variations in high..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device that suppresses variations in high... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4071493

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.