Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-28
2007-08-28
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S1540PB
Reexamination Certificate
active
11067871
ABSTRACT:
An apparatus for mitigating condensation formation on a device interface board during low-temperature semiconductor device testing includes a nozzle. The nozzle includes an input orifice for receiving gas from a gas source and at least one output orifice for discharging gas from the nozzle against a surface of the device interface board. The area of the at least one output orifice is substantially greater than the area of input orifice.
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Hsu Shou Ping
Peng Nai Liang
Brady III Wade James
Chan Emily Y
Nguyen Ha Tran
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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