Semiconductor device test system

Details Semiconductor device test system Semiconductor device test system

2007-08-28

2007-08-28

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

11067871

ABSTRACT:
An apparatus for mitigating condensation formation on a device interface board during low-temperature semiconductor device testing includes a nozzle. The nozzle includes an input orifice for receiving gas from a gas source and at least one output orifice for discharging gas from the nozzle against a surface of the device interface board. The area of the at least one output orifice is substantially greater than the area of input orifice.

REFERENCES:
patent: 6104202 (2000-08-01), Slocum et al.
patent: 6420885 (2002-07-01), Fredrickson
patent: 6420888 (2002-07-01), Griffin et al.
patent: 6703852 (2004-03-01), Feltner
patent: 6731127 (2004-05-01), Watts
patent: 6838897 (2005-01-01), Kim et al.
patent: 6842030 (2005-01-01), Kim et al.
patent: 6861861 (2005-03-01), Song et al.

Affiliated with

Also associated with

Rating

Semiconductor device test system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device test system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3855200