Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-05-10
2005-05-10
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C438S014000, C438S119000
Reexamination Certificate
active
06891386
ABSTRACT:
A semiconductor device socket, in which a semiconductor device is installed, includes a support member on which a substrate is placed, an anisotropic conductive sheet that acts as an intermediary in electric connection between the substrate and the semiconductor device, and heater which heats the anisotropic conductive sheet. The heater heats the anisotropic conductive sheet for expanding the sheet before the semiconductor device is installed in the semiconductor device socket. The semiconductor device is installed in the socket after the anisotropic conductive sheet has been expanded by heat from the heater.
REFERENCES:
patent: 5019944 (1991-05-01), Ishii et al.
patent: 6174179 (2001-01-01), Okabe
NEC Corporation
Patel Paresh
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