4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Hajime Matsuzawa

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Air pump operated test fixture and method for testing a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit for easily testing a logic circuit having a number of in

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Electronic device structure capable of preventing...

Active solid-state devices (e.g. – transistors – solid-state diode – With shielding
Reexamination Certificate

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Large-scale integrated circuit and method for testing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device socket and semiconductor device...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-596184

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