Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – For plural devices
Reexamination Certificate
2005-05-09
2011-12-20
Ngo, Ngan (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
For plural devices
C257S685000, C257SE25013
Reexamination Certificate
active
08080873
ABSTRACT:
A semiconductor device designed to facilitate testing. Superimposed first and second semiconductor chips each include a plurality of internal terminals, an external terminal, and a plurality of transistors. A plurality of wires connect the internal terminals, the transistors, and the external terminals of the first and second semiconductor chips in series.
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Ito Yoshito
Sekiyama Akinori
Tanaka Hiroyuki
Arent & Fox LLP
Fujitsu Semiconductor Limited
Ngo Ngan
Nguyen Dilinh
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