Semiconductor device, semiconductor device testing method,...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S189030

Reexamination Certificate

active

11215253

ABSTRACT:
A semiconductor device includes: a latch circuit that latches a given signal in a test mode; and a generating circuit that generates a signal that defines a program voltage used for programming of a memory cell in accordance with the signal latched in the latch circuit. The generating circuit includes: a circuit that generates the signal that defines an initial voltage of the program voltage; a circuit that generates the signal that defines a pulse width of the program voltage; and a circuit that generates the signal that defines a step width of the program voltage when the program voltage is a voltage that increases stepwise.

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