Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-01-16
2007-01-16
Clark, S. V. (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S724000
Reexamination Certificate
active
10632822
ABSTRACT:
A semiconductor device includes a first layer, a plurality of first test elements which are arranged in the first layer, a second layer which is different from the first layer and has a first surface and a second surface opposed to the first surface, the first surface of the second layer being adhered to the first layer, an opening portion which is arranged on the second surface of the second layer, and a plurality of pads which are arranged in the second layer and are electrically connected to the first test elements, a part of the pads being exposed from the opening portion.
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Clark S. V.
Kabushiki Kaisha Toshiba
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