Semiconductor device of tab structure, capable of ensuring ease

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

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Details

257666, 257691, 257694, 257737, H01L 2302

Patent

active

053348583

ABSTRACT:
A semiconductor device comprises a tape member, an IC chip mounted on the tape member, a plurality of leads arranged on the tape member each having one end connected to the IC chip and the other end provided with an area to be used for testing the IC chip and an insulation member for covering said plurality of leads except the one ends and the areas to be used for testing the IC chip, the tape member being provided with one or more one openings that reach the plurality of leads. With such an arrangement, the plurality of leads can be easily accessed and brought into contact with probes for testing the IC chip.

REFERENCES:
patent: 4701781 (1987-10-01), Sankhagowit
patent: 4837184 (1989-06-01), Lin et al.
patent: 5083191 (1992-01-01), Ueda

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