Semiconductor device mounting method, semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond

Reexamination Certificate

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C257SE23021, C257SE23060, C257S785000, C257S690000

Reexamination Certificate

active

10644603

ABSTRACT:
A wiring terminal is formed on a wiring substrate, and an electrode is formed on a semiconductor device. The width of the wiring terminal is smaller than the width of the electrode. When the semiconductor device is mounted on the wiring substrate, the wiring terminal becomes embedded in the electrode due to applied pressure.

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NA84035027 “Low Inductance Chip Tester Interposers” IBM Technical Disclosure Bulletin, Mar. 1984, US vol. # 26, Issue # 10A, p. # 5027-5030; Publication date Mar. 1, 1984.
Communication from Chinese Patent Office regarding counterpart application.
Communication from European Patent Office regarding counterpart application.

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