Semiconductor device manufacturing method and substrate...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Plural fluid growth steps with intervening diverse operation

Reexamination Certificate

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Reexamination Certificate

active

07968437

ABSTRACT:
Productivity and product yield, as well as the step coverage and the adhesion are improved. A film forming process includes an initial film forming step, and a main film forming step. In the initial film forming step, a step of supplying a material gas into a processing chamber to adsorb the material gas on the substrate, and a step of supplying a first reaction gas not containing oxygen atoms into the processing chamber to cause a reaction with the material gas adsorbed on the substrate in order to from a thin film on the substrate, are repeated multiple cycles to form the thin film with the specified thickness on the substrate. In the main film forming step, a step of supplying a material gas into the processing chamber to adsorb the material gas on the substrate, and a step of supplying a second reaction gas containing oxygen atoms into the processing chamber to cause a reaction with the material gas adsorbed on the substrate in order to form a thin film on the substrate, are repeated multiple cycles, to form the thin film with a specified thickness on the thin film that was formed on the substrate in the initial film forming step.

REFERENCES:
patent: 5237756 (1993-08-01), Hurwitt
patent: 7314835 (2008-01-01), Ishizaka et al.
patent: 2006/0177601 (2006-08-01), Park et al.
patent: 2006/0210713 (2006-09-01), Brcka
patent: 2006/0210723 (2006-09-01), Ishizaka
patent: 2006/0211224 (2006-09-01), Matsuda
patent: 2003-253444 (2003-09-01), None
patent: 2005-509093 (2005-04-01), None
patent: 2005-513813 (2005-05-01), None
patent: 2006-506811 (2006-02-01), None

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