Semiconductor device manufacturing: process – Gettering of substrate
Reexamination Certificate
2005-09-20
2011-10-04
Bryant, Kiesha (Department: 2891)
Semiconductor device manufacturing: process
Gettering of substrate
C438S149000, C438S150000, C118S072000, C118S073000, C134S001000, C134S001300, C134S002000, C257SE21212
Reexamination Certificate
active
08030182
ABSTRACT:
By hydrogen-terminating a semiconductor surface using a solution containing HF2−ions and an oxidant, the hydrogen termination can be quickly carried out. In this case, the semiconductor surface is silicon having a (111) surface, a (110) surface, or a (551) surface.
REFERENCES:
patent: 5810940 (1998-09-01), Fukazawa et al.
patent: 5944907 (1999-08-01), Ohmi
patent: 5954885 (1999-09-01), Ohmi
patent: 5972123 (1999-10-01), Verhaverbeke
patent: 6003243 (1999-12-01), Ohmi
patent: 6048406 (2000-04-01), Misra et al.
patent: 6066571 (2000-05-01), Usuda et al.
patent: 6346505 (2002-02-01), Morita et al.
patent: 6348157 (2002-02-01), Ohmi et al.
patent: 2004/0108575 (2004-06-01), Ohmi et al.
patent: 7-086224 (1995-03-01), None
patent: 8-181094 (1996-07-01), None
patent: 11-060377 (1999-03-01), None
patent: 11-204485 (1999-07-01), None
patent: 11-307497 (1999-11-01), None
patent: 2001-054768 (2001-02-01), None
patent: 2005-051141 (2005-02-01), None
patent: 2005-136437 (2005-05-01), None
“Ideal anodization of silicon” Yamani, Zain, et al. Appl. Phys. Lett. 70 (25) Jun. 23, 1997.
“Fundamentals of two-step etching techniques for ideal silicon-hydrogen termination of silicon(111)” Yang, S.-K. et al., J. Appl. Phys. 76 (7) Oct. 1, 1994.
Akahori Hiroshi
Ohmi Tadahiro
Teramoto Akinobu
Bryant Kiesha
Foley & Lardner LLP
Tadahiro OHMI
Ward Eric
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