Semiconductor device, manufacturing method and apparatus for...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond

Reexamination Certificate

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C257S737000, C257S772000, C257S762000, C257S766000, C257S767000, C257S748000, C257S750000

Reexamination Certificate

active

06969915

ABSTRACT:
A highly reliable semiconductor chip electrode structure allowing control of interface reaction of bonding sections even in the case of using two- or three-element solder used conventionally is disclosed. A solder alloy making layer for preventing dissolving and diffusion of tin into tin-based lead free solder is thinly formed on a UBM layer. The tin-based solder is supplied in solder paste or solder ball form. A combined solder alloy layer composed of a combination of intermetallic compounds, one of tin and the solder alloy making layer, and one of tin and the UBM layer, is formed by heating and melting.

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patent: 6184061 (2001-02-01), Wu et al.
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patent: 6224690 (2001-05-01), Andricacos et al.
patent: 6429046 (2002-08-01), Marlin
patent: 6476494 (2002-11-01), Hur et al.
patent: 9-36120 (1997-02-01), None
patent: 2001-150574 (2000-05-01), None
patent: 1995-8844 (1995-08-01), None

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