Semiconductor device lead inspection system

Details Semiconductor device lead inspection system Semiconductor device lead inspection system

1993-10-18

1995-03-28

Mancuso, Joseph

Image analysis

Histogram processing

For setting a threshold

348126, 348137, 356397, G01N 2188, G06K 920

Patent

active

054025052

ABSTRACT:
The invention is to a system and apparatus for determining the planarity of leads on a semiconductor device. An image system is used to locate the leads with reference to a reference plate on which the device is mounted, and a real-time reference which is used to provide a known correlation between image pixels and linear measurement such as mils.

REFERENCES:
patent: 4393401 (1983-07-01), Gorenflo
patent: 5157734 (1992-10-01), Chen et al.
patent: 5162866 (1992-11-01), Tomiya et al.
patent: 5189707 (1993-02-01), Suzuki et al.
patent: 5249239 (1993-09-01), Kida
patent: 5268743 (1993-12-01), Kida

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