Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2006-08-08
2006-08-08
Flynn, Nathan J. (Department: 2826)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S166000, C438S486000, C257S066000, C257S049000, C257SE29277, C257SE29137
Reexamination Certificate
active
07087505
ABSTRACT:
A method of manufacturing a thin-film semiconductor device substrate includes a step of forming a non-single crystalline semiconductor thin film on a base layer, and an annealing step of irradiating the non-single crystalline semiconductor thin film with an energy beam to enhance crystallinity of a non-single crystalline semiconductor constituting the non-single crystalline semiconductor thin film. The annealing step includes simultaneously irradiating the non-single crystalline semiconductor thin film with a plurality of energy beams to form a plurality of unit regions each including at least one irradiated region irradiated with the energy beam and at least one non-irradiated region that is not irradiated with the energy beam.
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Hiramatsu Masato
Jyumonji Masayuki
Kimura Yoshinobu
Matsumura Masakiyo
Nakano Fumiki
Advanced LCD Technologies Development Center Co. Ltd.
Flynn Nathan J.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Wilson Scott R.
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